Shaping the Glitch: Optimizing Voltage Fault Injection Attacks. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2019, n. 2, p. 199–224, 2019. DOI: 10.13154/tches.v2019.i2.199-224. Disponível em: https://ojs.ub.ruhr-uni-bochum.de/index.php/TCHES/article/view/7390.. Acesso em: 24 nov. 2024.